The theoretical limit of resolution for electron microscopes d = .61:lclambda: / n*sin( :alpha: ) | :lclambda: = h/(mv), n=0 (refractive index, EM uses a vacuum, :alpha: = angle.

Plug everything in and you get .005nm.

But as everyone knows, the EM can't produce images at that resolution because of constraints on the traditional lensing used to collect and produce the image, this makes the practical limit of resolution 1.5nm.

What I propose is that the full limit of resolution by an EM will be realized, what ideas do you all have for ways to overcome or go around the factors that account for the large difference between theoretical and practical limits of resolution?

 

and i put this thread in this forum because the uses of electron microscopy apply more to chemical and biological sciences, and this forum had no threads

this makes the practical limit of resolution 1.5nm.

 

The record is .0489 nanometers with this beast:

 

 

Ideas:

Minimize mechanical vibration, increase voltage!!

I have no clue what you guys are saying but it sounds smart.:stupid: :slaphead:

Pendry's paper on negative refractive indices is fascinating, though it has nothing to do with electron microscopy, it would however result in a perfect lens, which is rather groovy.

doi?

what?

whats the doi number so i can get it and read it

sorry, doi isn't something I'm familiar with.... here's a review article of his with some references tough:

 

http://www.sst.ph.ic.ac.uk/photonics/pdf/pw2article.pdf

What are induction and self-induction?

If these physical phenomena to use for explanation of processes, which happen in microscopes, will appear, that such appearances, as refraction and reflection of waves, does not exist. In reality there are only two phenomena - absorption and birth of new wave. The same adapt also to electrical charged particles.

Therefore, for obtaining the map of some part of a subject it is not in the least necessary to irradiate this part with a ray of a light or particles. It is enough to bring EM energy in the other place, and to fix outgoing directions of separate photons from the researched part. The problem of obtaining of a high-resolution rests on sensitivity of sensors and methods of decoding of outcomes.